ELECTRONOGRAPHIC INVESTIGATION OF SHORT-RANGE ORDER IN THE SURFACE LAYERS OF MELTS*)


    loading  Checking for direct PDF access through Ovid

Abstract

The examination of the structure of the surface layers in melts by the reflection electron diffraction has detected a shift of the diffraction bars due to the surface monolayer and subsequent atomic layers. The magnitude of the shift depends on the surface layer thickness. An analysis of structure curves revealed a difference between the first monoatomic layer and the bulk.

    loading  Loading Related Articles