An Apparatus for Measuring the High-Temperature Thermal Conductivity of Semiconductors and Their Melts

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Abstract

An installation for investigating the thermal conductivity of semiconductors and their melts over a wide temperature range (300–1100 K) is described. In contrast to the devices used earlier for this purpose, the thermal conductivity was measured in a hermetically sealed autoclave filled after evacuation with spectroscopically pure argon to prevent the oxidation, evaporation, and decomposition of the substance under study. The error of thermal-conductivity measurements did not exceed 8% at 1000 K.

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