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A method for measuring the thermal emf and thermal conductivity of conducting samples is described. After the temperature and potential differences are measured between the sample's ends, on which metal contacts are deposited, at a specified direct current, the current is turned off, and instantaneous values of the integral thermal emf are measured directly at the metal contacts. Using the results from measuring the temperature and potential differences during passage of the direct current, the electrical and thermal conductivities of the sample are calculated. A specific feature of this technique is the use of additional thick metal layers being in contact with the surfaces of the metal contacts at the sample's ends, which are aimed at stabilizing the temperature gradient along the sample when the current source is switched off.