High-precision assessment of interface lattice offset by quantitative HRTEM

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Abstract

Summary

We introduce a new method to determine the 'lattice offset' or 'rigid-body shift' between two crystals forming an interface. Our method relies on quantitative evaluation of high-resolution transmission electron microscopy images. Employing the (001)-orientated interface between Al and MgAl2O4 in parallel orientation as a model system we demonstrate that we can assess the interface lattice offset with a precision in the picometre range.

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