Study of surface topography and optical properties of Ge15Bi38Se47 films

    loading  Checking for direct PDF access through Ovid


Adherent and smooth amorphous GeBiSe films deposited by vacuum evaporation at substrate temperatures less than 30 °C have been studied for their structural and optical properties. The films were crystallized by thermal annealing and they were found to be polycrystalline in nature. A correlation between X-ray diffraction (XRD) data and surface topography is reported. Optical constants calculated from reflectance and transmittance data indicate semiconducting behaviour. The optical band gap of the as-deposited film is 1.0 eV. The measured optical contrast at 0.8 μm is 44%. No significant changes in the optical parameters have been observed after exposing the samples to laboratory ambient for a period of six months.

Related Topics

    loading  Loading Related Articles