Negative-differential-resistance effects in amorphous CulnS2 thin film

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The microstructure and the optical properties of amorphous CulnS2 thin films deposited on glass substrates by a single source thermal evaporation technique, are characterized using X-ray diffraction (XRD), scanning electron microscopy (SEM) and transmission and reflection measurements. Amorphous CulnS2 thin films sandwiched between gold and copper electrodes, show current-controlled electronic switching. The switching is believed to be associated rather with electronic processes than the thermal ones.

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