Facet reflectivity in the presence of a diffracting corner

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Abstract

Results and new theory are presented for the uncoated and coated facet reflectivity of a shallowly buried waveguide, taking account of the diffracting corner present at the air–semiconductor interface. The corner effects are shown to be most significant in the case of coated facets. The analysis also predicts the asymmetry introduced into the radiation pattern.

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