Examination of Peripheral Nerves with the Scanning Electron Microscope

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The theroretical apploications and advantages of the scanning microsope in peripheral nerve research are presented. The internal anatomy of the peripheral nerve can be distinctly examined, and long segments of axons can be examined without the necessity of tedious study of multiple sections. The SEM should make it possible to more readily study the migration of axon sprouts across a repair site. New concepts in teaching and research may develop from the use of this excellent tool.

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